References
[1] Low-Temperature Electronics, ed. by R. K. Kirshman (IEEE Press, New York, 1986), p. 491.
[2] B. Lengler, Cryog. 14, 439 (1974).
[3] S. R. Forrest and T. M. Sanders, Rev. Sci. Instr. 49, 1603 (1978).
[4] R. J. Prance, A. P. Long, T. D. Clark, and F. Goodall, J. Phys. E 15 (1982).
[5] A. T. Lee, Rev. Sci. Instr. 64, 2373 (1993).
[6] A. S. Sedra and K. C. Smith, Microelectronic Circuits (Saunders College Publishing, 1991).
[7] C. D. Motchenbacher and F. C. Fitchen, Low-Noise Electronic Design (John Wiley & Sons, New York, 1973).
[8] S. Christensson and I. Lundström, Solid-State Electronics 11, 813 (1968).
[9] A. v. d. Zeil, Noise in Solid State Devices and Circuits (John Wiley & Sons, New York, 1986).
Acknowledgments
I wish to thank my supervisors Per Delsing and David Haviland for their invaluable help and their vast experience in cryogenic experiments.
Several members at the Applied Solid State Physics group are thanked for their help during various phases of the work: Staffan Pehrson, Magnus Persson, Peter Wahlgren, Torsten Henning and Joakim Petersson to name a few.
Rickard Krook and Andreas Oberstedt at the Subatomic Physics group are thanked for the preparatory work of finding good references.
I am very grateful to Randall K. Kirschman for supplying the MESFETs, without which this work would not have been possible.
Finally, I wish to thank my parents for their great support of my studies. It has meant much to me.
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