TIF110 Advanced Analysis Methods (7.5 hec)

Course starts on Monday 2012-01-16 at 08.00 in FL72

Course coordinators and examiners
Lena Falk 031 - 772 3321 lklfalk at chalmers.se
Janusz Kanski 031 - 772 3313 janusz.kanski at chalmers.se
     
Aim of course
obtain a knowledge of imaging, spectroscopy and diffraction techniques that are used in research and development
hands-on experience of selected techiques
         
Contents
Imaging
analytical electron microscopy
    scanning electron microscopy techniques
      atom probe field ion microscopy
      scanning probe microscopy
      nuclear magnetic resonance imaging
      tools for probing biological systems  
         
Spectroscopy    electron energy loss spectroscopy
       Auger electron spectroscopy
      

X-ray photoelectron spectroscopy

    X-ray energy dispersive spectrometry
        secondary ion mass spectroscopy
        nuclear magnetic resonance spectroscopy
    mass spectrometry
        Raman spectroscopy
      infrared spectroscopy
         
Diffraction    X-ray diffraction  
       neutron diffraction  
         
Organisation       
Lecture series    16 lectures  
       80 % attendance required  
         
Lab visits      
         
Short project     use at least two different techniques for the characterization of a selected material
         
Examination   written project report  
      oral presentation of project  
         
Course literature    

The essential parts of the lectures are summarized in lecture notes that are available in a separate folder.  User name and password are required for access.

 

Schedule 2012  --  Lectures and lab visits
Day Time Place Topic Lecturer
Monday 16 /1 08.00 - 09.45 FL72 Introduction and course contents Lena Falk / Janusz Kanski
Thursday 19/1 08.00 - 09.45 FL72 X-ray diffraction Vratislav Langer
      Lab tour 1: XRD  
Friday 20/1 13.15 - 15.00 FL52 Variable pressure scanning electron microscopy and  Lena Falk
      Focused ion beam / scanning electron microscopy  
      Lab tour 2: TEM, SEM, ESEM, FIB/SEM, APFIM  
Monday 23 /1 08.00 - 09.45 FL72 Analytical electron microscopy   Lena Falk
Thursday 26/1 08.00 - 09.45 FL72 Scanning probe microscopy

Alexandre Dmitriev /

          Maj Hanson
      Lab tour 3: SPM

 

 
Friday 27/1 13.15 - 15.00 FL52 Raman and infrared spectroscopy Mikael Käll
      Lab tour 4: Raman  
Monday 30/1 08.00 - 09.45 FL72 X-ray photoelectron spectroscopy Janusz Kanski
Thursday 2/2 08.00 - 09.45 FL72 Auger electron spectroscopy Janusz Kanski
      Lab tour 5: AES, XPS  
Friday 3/2 13.15 - 15.00 FL52 Secondary ion mass spectrometry Jukka Lausmaa
Monday 6/2 08.00 - 09.45 FL72 Errors in measurement, statistical significance Lena Falk / Janusz Kanski
Friday 10/2 13.15 - 15.00

F7103

MAX lab Jesper Andersen
Monday 13/2 08.00 - 09.45 FL72 Neutron diffraction and neutron sources Sten Eriksson
Friday 17/2 13.15 - 15.00 FL62 Nuclear magnetic resonance imaging and Mats Andersson
      spectroscopy and    
      Mass spectrometry    
Thursday 23/2 08.00 - 09.45 FL72 Atom probe tomography Hans-Olof Andrén
  10.00 - 10.45 FL72 Report writing Lena Falk / Janusz Kanski
Monday 27/2 08.00 - 09.45 FL72 Analytical tools for probing biological systems Fredrik Höök
      Lab tour 6: Bio    
Thursday 1/3 08.00 - 11.45 FL72 Oral presentations of projects    
Friday 2/3 13.15 - 15.00 FL62 Oral presentations of projects    
           
Schedule 2012  --  short project
Day Time Place  
Monday 6/2 09.45 FL72 Notice of short project and selected techniques due after the lecture
Thursday 1/3 08.00 FL72   Written project report due at the oral presentation
Friday 2/3 13.15 FL62   Written project report due at the oral presentation

 

NOTICE-BOARD